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Description

RESPA-405N m, 40kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker's flagship RESP probes are the preferred choice for high sensitivity silicon probe imaging in contact mode in air. Every aspect of the RESP design has been optimized to provide the most accurate profiling of

5 Tip Set Back( RNG): 0 - 3

Max Overhang = 5 nm

RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate

- "C" Cantilever: 0

Bruker also offers solid diamond probes with pyramidal tips

Quantity=5

5+/-5 Tip Radius (Nom): 40 Tip Set Back( RNG): 15-25 Tilt Compensation: 7 +/- 1

Asymmetric Tip

Bruker's MESP-LM-V2 is the established choice for Magnetic Force Microscopy

UNCALIBRATED

Roughness Sample

the RTESPA-150-30 provides accurate nanomechanical mapping on soft samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants

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