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Description

TESPA-V2-SSTESP V2, SUPERSHARP, 10 PACK DESCRIPTION Pack of 10 High quality etched silicon probes with backside Aluminum reflex coating, for TappingMode and other non contact modes. Combines the high consistency of the V2 design with a high aspect ratio, supersharp tip guaranteed by Bruker's proprietary process. Unmounted for use on standard AFMs.

Heavy specimens may also be prepared for viewing in a SEM using Tempfix™ (or the Glue Gun - see details in our non-conductive section) and Leit-C-Plast™

Window/Aperture Size for Ultra-Thin

electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)

SEM Finder Grid

Single Clip mount

The Pt-Ir coating on the front side of the cantileverprovides a metallic electrical path from the cantilever die to the apexof the tip

It also holds FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for subsequent TEM imaging

[41638-13-5]

Extra Open Area: Pitch 64µm

16116-40 - PELCO SEMClip™

Chemically

Usability: The calibrated pattern covers the entire standard

Exchange/Return Notes