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Description

ElectriMulti75-GElectrical, Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample

Allen key for set screw included

Box inside dimensions are: 4-5/8" x 2-2/4" x 1-5/16" (11

5+/-2 Tip Radius (Nom): 100 Tip Radius (Max): 150 Tip Coating: Conductive Diamond Tip Set Back (Nom): 9

Coercivity: < 400 Oe

Can be used for SEM

0000067 500° C

such as our model 16068 to avoid possible damage to heat sensitive specimens

6 Cantilever Thickness (RNG): 0

The bulk specimen holder holds irregular and round specimens up to a diameter of 32mm (1-1/4")

The #602-20 and #602-21 contain:

more consistent results

01843N - Carbon Film only on 300 mesh