Planotec Silicon Calibration Specimen - 10µm Pitch

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Planotec Silicon Calibration Specimen - 10µm PitchDESCRIPTION Useful for magnification calibration or image distortion check in SEM and LM. Single crystal silicon, 5mm x 5mm. The squares repeat every 10m (0. 01mm). The dividing lines are about 1. 9m wide, formed by electron beam lithography. A broader marking line is written every 500m (0. 5mm) which is useful for light microscopy. Lines are etched, and approximately 300nm deep. Available unmounted or mounted on SEM specimen mounts. A certificate of

Ideal for correlative microscopy

ceramics and small wafers

blue epoxy-coated 5 110mm SS 0

2 separate 0

0mm in diameter with a 2

10mm 5326 DUMONT Electronic

Adjustable angle from 0-180°

MFM starter kit for Dimension series SPMs DESCRIPTION

or Ni grids

The soft touch surface avoids cutting or damaging hairs

For non-electrical applications where wear resistance is required

Handle and transport grids and wafers without the use of tweezers Use this system for picking up delicate lightweight material with finger controlled vacuum

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