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Description

AD‌-40-P40DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 40nm base diameter, combined with a high 40N m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM. Tip Geometry:

63 Cantilever Geometry: Special Cantilevers Number: 1 Back Side Coating: Reflective Al

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8N/m Cantilever Thickness (Nom): 3 Cantilever Thickness (RNG): 2

electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)

Max Overhang = 5 nm

Tip Geometry: Rotated (Symmetric) Tip Height: 3 - 8 Front Angle: 15+/-2 Back Angle: 25+/-2 Side Angle: 17

see the whole series of calibrated probes

Conductive Probes

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

2 Cantilever Geometry: Rectangular Cantilevers Number: 3

Spring constants are individually calibrated and guaranteed within 20%

"A" Cantilever: 10

Exchange/Return Notes